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 Silizium-PIN-Fotodiode Silicon PIN Photodiode
BPW 34 S
Chip position
0...0.1 1.2 1.1 0.3
1.1 0.9
0.2 0.1
6.7 6.2 4.5 4.3 1.8 0.2
0.9 0.7
GEO06863
Mae in mm, wenn nicht anders angegeben/Dimensions in mm, unless otherwise specified.
Wesentliche Merkmale q Speziell geeignet fur Anwendungen im Bereich von 400 nm bis 1100 nm q Kurze Schaltzeit (typ. 20 ns) q geeignet fur Vapor-Phase Loten und IRReflow-Loten (JEDEC level 4) Anwendungen q Lichtschranken fur Gleich- und Wechsellichtbetrieb q IR-Fernsteuerungen q Industrieelektronik q "Messen/Steuern/Regeln"
Features q Especially suitable for applications from 400 nm to 1100 nm q Short switching time (typ. 20 ns) q Suitable for vapor-phase and IR-reflow soldering (JEDEC level 4) Application q Photointerrupters q IR remote controls q Industrial electronics q For control and drive circuits
Typ Type BPW 34 S
Bestellnummer Ordering Code Q62702-P1602
Semiconductor Group
1
1997-11-19
feo06862
Photosensitive area 2.65 mm x 2.65 mm
Cathode lead
4.0 3.7
1.7 1.5
0...5
BPW 34 S
Grenzwerte Maximum Ratings Bezeichnung Description Betriebs- und Lagertemperatur Operating and storage temperature range Sperrspannung Reverse voltage Verlustleistung, TA = 25 C Total power dissipation Symbol Symbol Top; Tstg VR Ptot Wert Value - 40 ... + 85 32 150 Einheit Unit C V mW
Kennwerte (TA = 25 C, Normlicht A, T = 2856 K) Characteristics (TA = 25 C, standard light A, T = 2856 K) Bezeichnung Description Fotoempfindlichkeit, VR = 5 V Spectral sensitivity Wellenlange der max. Fotoempfindlichkeit Wavelength of max. sensitivity Spektraler Bereich der Fotoempfindlichkeit S = 10 % von Smax Spectral range of sensitivity S = 10 % of Smax Bestrahlungsempfindliche Flache Radiant sensitive area Abmessung der bestrahlungsempfindlichen Flache Dimensions of radiant sensitive area Abstand Chipoberflache zu Gehauseoberflache Distance chip front to case surface Halbwinkel Half angle Dunkelstrom, VR = 10 V Dark current Spektrale Fotoempfindlichkeit, = 850 nm Spectral sensitivity Quantenausbeute, = 850 nm Quantum yield Symbol Symbol S S max Wert Value 80 ( 50) 850 400 ... 1100 Einheit Unit nA/Ix nm nm
A LxB LxW H
7.00 2.65 x 2.65
mm2 mm
0.3
mm
IR S
60 2 ( 30) 0.62 0.90
Grad deg. nA A/W Electrons Photon
Semiconductor Group
2
1997-11-19
BPW 34 S
Kennwerte (TA = 25 C, Normlicht A, T = 2856 K) Characteristics (TA = 25 C, standard light A, T = 2856 K) Bezeichnung Description Leerlaufspannung, Ev = 1000 Ix Open-circuit voltage Kurzschlustrom, Ev = 1000 Ix Short-circuit current Anstiegs und Abfallzeit des Fotostromes Rise and fall time of the photocurrent RL= 50 ; VR = 5 V; = 850 nm; Ip = 800 A Durchlaspannung, IF = 100 mA, E = 0 Forward voltage Kapazitat, VR = 0 V, f = 1 MHz, E = 0 Capacitance Temperaturkoeffizient von VO Temperature coefficient of VO Temperaturkoeffizient von ISC Temperature coefficient of ISC Rauschaquivalente Strahlungsleistung Noise equivalent power VR = 10 V, = 850 nm Nachweisgrenze, VR = 10 V, = 850 nm Detection limit Symbol Symbol VO ISC tr, tf Wert Value 365 ( 300) 80 10 Einheit Unit mV A ns
VF C0 TCV TCI NEP
1.3 72 - 2.6 0.18 4.1 x 10- 14
V pF mV/K %/K W Hz cm * Hz W
D*
6.6 x 1012
Semiconductor Group
3
1997-11-19
BPW 34 S
Relative spectral sensitivity Srel = f ()
100
OHF00078
Photocurrent IP = f (Ev), VR = 5 V Open-circuit-voltage VO = f (Ev)
10 3
OHF01066
Total power dissipation Ptot = f (TA)
10 4 mV
S rel %
80
P
A
VO
10 3
160 mW Ptot 140 120 100
OHF00958
10 2
VO
60
10 1
40
P
10 2
80 60
20
10 0
10 1
40 20
0 400 500 600 700 800 900 nm 1100
10 -1 10 0
10 1
10 2
10 0 10 3 lx 10 4 EV
0
0
20
40
60
80 C 100 TA
Dark current IR = f (VR), E = 0
4000
OHF00080
Capacitance C = f (VR), f = 1 MHz, E = 0
100
OHF00081
Dark current IR = f (TA), VR = 10 V, E = 0
10 3
OHF00082
R
pA
C
pF 80
R nA
10 2
3000
70 60
2000
50 40 30
10 1
1000
10 0
20 10
0 0 5 10 15 V VR 20
0 -2 10
10 -1
10 0
10 1
V 10 2
10 -1
0
20
40
60
VR
80 C 100 TA
Directional characteristics Srel = f ()
40 30 20 10
0 1.0
OHF01402
50 0.8 60
0.6
70
0.4
80
0.2 0
90
100
1.0
0.8
0.6
0.4
0
20
40
60
80
100
120
Semiconductor Group
4
1997-11-19


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